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Welcome To Test & Measurement! You have reached the latest, but not the last, editorial section
of the EDTN Network's Design Center where we will strive to continue
to expand our We will be covering all manner of T&M, from testing an individual device on an uncut wafer right up to the most sophisticated analyzers and such. We will concern ourselves with techniques, technologies, products, quality issues and trends. There is not one EE who is not using or specifying some kind of T&M in their work and we will listen to your needs to ensure we cover the topics that concern you. There will also be columns from experts in the industry which will be selected for the simple premise that they must be of direct use to you. Those of you who know me probably think of me as the "analog" guy and that is not untrue. You will find our Analog Avenue section in the Design Center to be one of the busiest, most frequently-changing areas on our site -- and that will continue -- but although analog semiconductors and engineering are my specialization, they have not always been my career. Having spent some years as a VP at a video test & measurement company I feel at least partially qualified to speak on some technologies and techniques. Where I feel I cannot offer a constructive viewpoint I will ask others. Again, this is just the start of this editorial area. The value of the content to you will increase with every change and update that we make, and we are totally open to change in order to improve. Like all our editorial areas in the Design Center we are not limited by the many restrictions placed on editing a print publication; we have no editorial ratio (the ratio of editorial material to advertising, typically 40 to 45% in a print publication), we have no basic restrictions on length (if a story needs 500 words or 5000, it really is "whatever it takes"), we have speed on our side (a story can be published in minutes, or we can correct our errors in seconds!) We also do not take up space on your desk, but neither can you use our publication as a doorstop. We would encourage you to bookmark the front page of T&M and come visit us often. Home Column Announcements Editorial Application Note PLD EDA Tools Analog DSP EDA Embedded Systems Power Test
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