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 Instrumentation I/O Enters a New Age With USB and Local Area Networking by Bertram S. Kolts
For decades the IEEE-488 instrumentation bus has been the standard for programmable instrument control. But, it's now being challenged by two options: Universal Serial Bus and Ethernet-based local area networking. In this article, Manufacturing Development Engineer Bertram Kolts of Agilent Technologies' Electronic Products and Solutions Group examines the trade-offs for each.
Recent Advances in Jitter and Timing Measurement Technology presented by Dr. Michael Lauterbach, Director-Product Management, LeCroy Corporation
Click here to link to a recent Webcast that focusesed on techniques for making timing measurements and performing jitter analysis of high-speed serial signals. The discussion, presented by Dr. Michael Lauterbach of oscilloscope-maker LeCroy Corp., examines methods for identifying and troubleshooting sources that contribute to signal jitter in time, frequency, and statistical domains.
Handheld RF Spectrum Analyzer Raises the Bar to 4 GHz (Product of the Week)
Fluke Boosts Handheld Scope Family by Doubling Bandwidth
Transparent-Packaged Chip Senses Color
More Product Reviews
Technical Features.
Instrumentation I/O Enters a New Age With USB and Local Area Networking by Bertram S. Kolts
Emerging Test Challenges for Multi-Level-Signal Gigabit Ethernet—Part 2: Timing and Functional Testing Issues by George Schroeder
Emerging Test Challenges for Multi-Level-Signal Gigabit Ethernet—Part 1: Introduction by George Schroeder
Debugging a PCI Bus With a Mixed-Signal Oscilloscope—A Real-World Example by Vivian Patlin
Precision Analog-to-Digital Converter Architecture Trade-Offs by Robert Schreiber
Test Resource Partitioning for Concurrent Test—Part 3: A Cell-Phone Example by Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink
Test Resource Partitioning for Concurrent Test—Part 2: The Challenges Ahead by Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink
Improving the Accuracy and Speed of Electronic-Load Current Measurements by Jim Dougherty and Isaac Benatar
Test Resource Partitioning for Concurrent Test—Part 1: Introduction by Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink
Boundary-Scan Testing—Part 4: Backplane System Testing by Adam Ley
Boundary-Scan Testing—Part 3: Some Board-Level DFT Guidelines by Gerry Morgan
Boundary-Scan Testing—Part 2: Guidelines for Design by Dave Bonnett
Fundamentals of HALT/HASS Testing by Jon Semancik
Boundary-Scan Testing—Part 1: An Introduction by Dr. R.G. "Ben" Bennetts
Spectral Analysis with Deep-Memory FFT Digital Oscilloscopes—A Practical Application by Marty Grove
Wireless Network Testing on the Threshold of 3G by Sailaja Vepa
More Technical Features
Special Reports Archive
Editorial.
GPS Jammers and Spy-vs.-Spy
My Techno Crystal Ball: Harry Potter's Got Nothin' On Me—Some Year-End Observations
Good and Evil in the Garden of Outsourcing: A Real-World Tale of Intrigue (and Woe)
ChipCenter Previews Test-and-Measurement Report
Hey, I Can See The Ground Under There!
NASA, NORAD, Amateur Radio, and Me
The Photonic Last Mile: Real, Imagined, or Perverse?
It's Information, Not Data
Engineering, Lost Jobs, and The China Syndrome
Peace, Love, and Linux: The Penguin Takes On Redmond XP
Striking Fool's Gold
The Test of Test
Toys of Seasons Past
More Editorials
Guest Column.
Vaporware Chips—Cause or Effect of a Change in the Semiconductor Industry?
Eonic Solutions' Chairman and Marketing Director Eric Verhulst offers his observations on ASICs/SoCs in a "Letter to the Editor" he wrote in response to ChipCenter Senior Technology Editor Alex Mendelsohn's year-end observations through a techno crystal ball.
More Guest Columns
Jitter Measurement Techniques
Jitter is defined as deviation in a clock signal's transition from its ideal position. A consistent method---and precise equipment---must be used when measuring clock jitter. Author Nelson Soo outlines a method you can use to ascertain cycle-to-cycle jitter, period jitter, and long-term jitter.
Oscilloscope designs have used fully differential amplifiers for decades. Why did it take so long for them to appear as commercial ICs? Discover why in "Race Cars, Oscilloscopes, and Fully Differential Amplifiers" by ChipCenter EE Expert Dennis Feucht.
Spectral Analysis with Deep-Memory FFT Digital Oscilloscopes—A Practical Application by Marty Grove
More Application Articles
Test Links
This page lists some current URLs that you may find of value if you're involved with data acquisition and test. The Web sites present material ranging from tutorial papers to listings of hardware vendors and available software.
Calendar
Find exhibitions, conferences, and educational events that are of direct interest to you as a design and development engineer.
Technology Diary
Technology developments of interest related to Test and Measurement engineering.
ChipCenter Reference Library
This is your access point for lots of good information covering applications, design tools, consultants, intellectual property, trade shows and standards.
Standards Watch
Here is your access point to the standards world.
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