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Date	Author	Title
03/11/03	Bertram S. Kolts	Instrumentation I/O Enters a New Age With USB and Local Area Networking
02/13/03	George Schroeder	Emerging Test Challenges for Multi-Level-Signal Gigabit Ethernet—Part 2: Timing and Functional Testing Issues
01/09/03	George Schroeder	Emerging Test Challenges for Multi-Level-Signal Gigabit Ethernet—Part 1: Introduction
12/20/02	Vivian Patlin	Debugging a PCI Bus With a Mixed-Signal Oscilloscope—A Real-World Example
11/01/02	Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink	Test Resource Partitioning for Concurrent Test—Part 3: A Cell-Phone Example
10/02/02	Robert Schreiber	Precision Analog-to-Digital Converter Architecture Trade-Offs
09/12/02	Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink	Test Resource Partitioning for Concurrent Test—Part 2: The Challenges Ahead
08/06/02	Jim Dougherty and Isaac Benatar	Improving the Accuracy and Speed of Electronic-Load Current Measurements
07/12/02	Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink	Test Resource Partitioning for Concurrent Test—Part 1: Introduction
06/10/02	Adam Ley	Boundary-Scan Testing—Part 4: Backplane System Testing
05/16/02	Gerry Morgan	Boundary-Scan Testing—Part 3: Some Board-Level DFT Guidelines
03/22/02	Dave Bonnett	Boundary-Scan Testing—Part 2: Guidelines for Design
03/01/02	Jon Semancik	Fundamentals of HALT/HASS Testing
02/15/02	Dr. R.G. "Ben" Bennetts	Boundary-Scan Testing—Part 1: An Introduction
01/07/02	Sailaja Vepa	Wireless Network Testing on the Threshold of 3G
12/07/01	Leonard Staller	Improving A/D Converter Resolution by Oversampling and Averaging—Part 3: When Oversampling and Averaging Will Work
09/15/01	Leonard Staller	Improving A/D Converter Resolution by Oversampling and Averaging—Part 2
07/27/01	Leonard Staller	Improving A/D Converter Resolution by Oversampling and Averaging
05/31/01	Phil Heredge	The World Of Test: A Test Exec Speeds Automotive Production-Line Development
04/19/01	Steve Sunter	An Overview of the 1149.4 Architecture
03/20/01	Bryan Lord	Bringing Bit-Error-Rate Testing Up to Speed
03/01/01	Steve Sunter	The IEEE-1149.4 Architecture's Instruction Set
01/10/01	Brian R. Wilkins	An Introduction to IEEE-1149.4 Analog and Mixed-Signal Boundary-Scan Test
11/22/00	Yiannis Pavlou	Data Acquisition Fundamentals: Part II of a Two-Part Series
11/02/00	Yiannis Pavlou	Data Acquisition (DAQ) Fundamentals: Part I of a Multi-Part ChipCenter Series
10/18/00	Hob Wubbena	An Engineer's Checklist: A Roundup of Measurement Programming Software
09/14/00	Alexander Goncharenko	Mixed-Signal TestingýWithout ATE
08/16/00	Henrik Liebau	Controlling Bus Activity for PCI-X Testing
07/11/00	Dr. Kenneth F. Hatch	Dithering Can Improve Your Data Converter's Differential Non-Linearity
06/20/00	Doyle Mills	Troubleshooting Errors in a SONET Network
06/06/00	Jon Turino	Use DFT and BIST To Slash Your ASIC's Time-to-Market
05/31/00	Dr. Steven D. Corey and Dima Smolyansky	Characterizing Interconnects Using Time Domain Reflectometry: Determining the Simplest Model for the DUT (Part 3 of 3)
05/19/00	Dr. Steven D. Corey and Dima Smolyansky	Characterizing Interconnects Using Time Domain Reflectometry: The Single-Line Modeling Approach (Part 2 of 3)
05/11/00	Dr. Steven D. Corey and Dima Smolyansky	Characterizing Interconnects Using Time Domain Reflectometry (Part 1 of 3)
04/18/00	Carlos Abascal	One In a Thousand: Tracking Down That Elusive Missed Interrupt
04/10/00	Dany Cheij	Prototyping Test Systems in Software Using IVI Simulation
03/31/00	Mike Bayda	Understanding and Developing Automated Test Application Software, Part Two
03/17/00	Mike Bayda	Understanding and Developing Automated Test Application Software, Part One
02/28/00	Jon Turino	System-On-A-Chip Testability Tradeoffs
02/17/00	Dr. Steven Corey	How To Characterize Differential Lines Using Time Domain Reflectometry
02/09/00	Dany Cheij	Tune Up Your Test System With IVI Drivers
02/02/00	Glenn Fasnacht	Why Expensive Equipment Isn't Required for High-Accuracy Sound Quality Measurements
01/31/00	Bob Masta	Dither Tricks 2: The Single-Bit ADC
01/18/00	Jon Turino	Embedded Memory Test Options for Systems-On-A-Chip
01/10/00	Duane Brown	How To Make Wide-Range Resistance Measurements With Sub-ppm Accuracy
12/22/99	Bob Masta	Dither Tricks
12/16/99	Alex Karolys and Bruce Swanson	A Network of MEMS-based Smart Sensors Can Enhance Data Gathering: A Study In Signal Conditioning
12/08/99	Helen Muterspaugh	Making Measurements with A Digital Oscilloscope
11/15/99	Bob Masta	Dither: Making a Lemon Into Lemonade -or- Nature Finally Gets Genenerous
11/01/99	Mike Beyers	Debugging Modern Power Electronics: Seeing the Whole Picture
10/12/99	Bob Masta	Spectral Averaging for Pre-Trigger Correlation
10/05/99	Mark D. Bailey	Selecting, Derating and Protecting Relays
09/15/99	Bob Masta	Synchronous Waveform Averaging: Pre-Trigger Reverse Correlation
09/10/99	Chris Kelly	Diagnosing and Verifying Designs With a Mixed-Signal Oscilloscope
08/16/99	David Heintz and Scott Stever	Sources of Errors in Temperature Measurements
07/07/99	Bob Masta	Synchronous Waveform Averaging: Triggering the Magic Bullet
06/16/99	Bob Masta	Synchronous Waveform Averaging: Magic Bullet for Noise
06/16/99	Mark D. Bailey	Generating DTMF Signals With An Arbitrary Waveform Generator
5/20/99	Don Whiteman	Probing the Lilliputian World of Electronics Circuits
4/9/99	David Heintz	Data Acquisition Fundamentals
3/12/99	Mark D. Bailey	Generating Low Duty-Cycle Pulses with a Function Generator
2/2/99	David Heintz & Scott Stever	Relay Life and Preventative Maintenance
12/15/98	David Heintz & Scott Stever	Sources of Measurement Errors in Digital Multimeters
11/23/98	Christopher Kelly	Making Measurements in Electronics Test Systems

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