Harris Semiconductor announced the availability of a new insulated gate
bipolar transistor (A HREF="http://www.semi.harris.com/igbt/" target=new>IGBT) family that
combines the best features of A HREF="http://www.semi.harris.com/igbt/" target=new>MOSFETs
and bipolar transistors -- high impedance and low on-state conduction losses.
Harrisý new non-punch through (NPT) series of N-channel 1200V IGBTs provide
rugged, high-efficiency operation in a variety of high-voltage switching
applications where low conduction losses are essential.
"The development of this process technology and product families
underscore our commitment to the industrial marketplace," says Tom
Daly, Harrisý director of industrial power marketing. "Our new high
voltage NPT technology eliminates the need to choose between fault tolerance
and low losses ý our products provide designers the best of both worlds.
Whatýs more, we trim design time by offering temperature-compensated SABER
models validated over a wide range of operating conditions."
Harrisý NPT family includes 18-, 20-, 27- and 30-ampere IGBTs which
provide low saturation voltage (VCE(SAT))
and reduced turnoff losses. They are immediately available in a variety
of options and in B- and C-speed grades. The B-speed parts are tailored
for use in switched-mode power supplies, welders and uninterruptible power
supplies (UPS). The C-speed products are ideally suited for use in AC motor
controls and motor drives.
The B-speed grade IGBTs, HGTG27N120BN and HGTG18N120BN, offer the designer
significantly higher operating frequencies required for switch-mode power
supply, welding and UPS applications. Both devices offer 40KHz operation
at the rated current. Unlike competing NPT designs, Harrisý B-speed products
provide lower turn-off losses. The HGTG18N120BND includes an anti-parallel
diode co-assembled in a TO-247 package.
The C-speed grade IGBTs, HGTG30N120CN and HGTG20N120CN, are ideally
suited for AC motor control and motor drive applications where fault tolerance,
low saturation voltage and switching losses improve circuit
efficiency and reliability. Both IGBTs have a typical fall time of 350
nanoseconds at junction temperatures of 150ý
C and short circuit withstand times of 15 microseconds at 15V. The 30A
device has typical collector-to-emitter saturation voltage of 2.1V at 25ý
C and 2.9V at 150ý C. The positive temperature
coefficient allows for easy paralleling of devices. The HGTG20N120CND includes
an anti-parallel diode co-assembled in the same package. Complete datasheets
are available on Harris Semiconductorýs website.