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Pin Sharing: How to combine Test and System I/O by IBM Microelectronics IBM's CMOS application-specific ICs (ASICs) products include options with large numbers of signal I/Os. However, few ASIC engineers are willing to dedicate many signal I/O lines for component testing. By following the guidelines in this application note, the ASIC designer can share system I/O functions with test I/O functions, maximizing utilization. Click here for the full Application Note.
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