ChipCenter Questlink
SEARCH CHIPCENTER
Search Type:
Search for:




Knowledge Centers
Product Reviews
Data Sheets
Guides & Experts
News
International
Ask Us
Circuit Cellar Online
App Notes
NetSeminars
Careers
Resources
FAQ
EE Times Network
Electronics Group Sites

  Application Note

Pin Sharing: How to combine Test and System I/O
Functions on a Single Pin

by IBM Microelectronics

IBM's CMOS application-specific ICs (ASICs) products include options with large numbers of signal I/Os. However, few ASIC engineers are willing to dedicate many signal I/O lines for component testing. By following the guidelines in this application note, the ASIC designer can share system I/O functions with test I/O functions, maximizing utilization.

Click here for the full Application Note.

Home    Product of the Week    App Notes    Tech Notes    Newsletters   
Click here to get your listing up.

Copyright © 2003 ChipCenter-QuestLink
About ChipCenter-Questlink  Contact Us  Privacy Statement   Advertising Information  FAQ