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Page 2 of 2 The second mechanism is called dynamic power consumption, and is caused by
nodal (both internal and external) switching activity. Whenever a CMOS node changes state, it must charge or discharge its load capacitance.
This results in a loss of energy. The energy can be computed as shown in Equation (2), where Vp is the power-supply voltage
and T is the clock period.
The result of this computation tells us that the dynamic power consumption Pd
caused by the switching of circuit nodes not only is proportional to both frequency and load capacitance, but is also proportional to the
square of the supply voltage.
The third mechanism of power dissipation in static CMOS is short-circuit dissipation. This occurs because both the NMOS and PMOS
transistors are on in a circuit for a short instant of time dt (related to the rise and fall times of a gate
tr and tf) during a state change. Simulations have shown that
the amount of power dissipation caused by this short-circuit effect is related to both the input and output rise and fall times. The loading
of the output of a CMOS gate also has a significant effect on the amount of power dissipated. The best design rule here is to ensure a
moderate load with input and output rise and fall times being roughly symmetrical. Equation (3) quantifies the short-circuit dissipation
Psc for an unloaded inverter circuit.
In Equation (3), b is the transistor gain, VP
is the power-supply voltage, VT is the transistor threshold voltage, T is the clock period, and t
is the average rise and fall time of an input signal.
The power dissipation in a static CMOS chip can thus be summarized to be directly proportional to the following major factors:
Due to effects such as subthreshold leakage currents, the power dissipation in a submicron static CMOS chip can also be summarized to be
related in a nonlinear fashion to the following other factors:
Power Reduction Criteria
As we have just seen in the previous analysis, power dissipation mechanisms are related to four basic parameters found in any CMOS VLSI
chip:
The first of these parameters, size, is an inherent property of using VLSI design techniques in the first place, and we can
guarantee that chip sizes, especially in the current wake of SOC design policies, will only increase in the years to come. The number of gates
in any design can, however, be controlled by careful design strategies.
The second parameter, frequency, will also follow the common trend of increasing in the future. Design techniques can be applied
here to reduce speed by trading for gates (parallel design, heavy pipelining) and adding intelligent control: activity sensing, on/off control at
module boundaries, external activation and deactivation of portions of a chip, say by interrupt and/or register control bits.
The third parameter, voltage, will also follow a common trend, which is to reduce. How far depends on the technology used and a
device's application and environment. We have seen reductions from 5 V to 3.3 V, 2.5 V, 1.8 V, and more recently to 1 V. How low we can actually go
depends heavily on clever circuit design techniques enabling lower noise margins to be tolerated.
The fourth parameter, technology, will follow scientific breakthroughs, but also follows the common trend of getting smaller.
How small depends mainly on process technology and innovations in physics and chip design. We are now down to about 0.1 µm.
If we are serious about saving power in a design at the system level, then we must concentrate on reducing both a chip's operating frequency(ies)
and its operating voltage(s), as these are really the only two parameters as a user of a chip we have power over. On another level of
granularity, the question becomes "How many nodes are actually switching in unit time?" Obviously this figure is going to be application-dependent, but
typically a significant number of nodes will always be switching to perform some measure of work (or else what are we designing
an electronic shoe
box?). However, when a unit is not being used, a major saving could be made by powering it down completely. This is really a software or firmware
issue, unless automatic hardware activity detection is built into a chip. The Blackfin DSP attempts to address all of these issues, and
achieves some measure of success in each area as we shall see in the next article.
Conclusion
Lowering power dissipation is a key criterion when designing modern ultra high speed, often massively parallel, very high gate count VLSI chips. These
design techniques become paramount when applied to portable computing and communications devices.
References
UCSC Extension VLSI Design Course, Low-Power VLSI Design Techniques, 2000.
Real-Time Processing Using DSPs, FPGAs & uCs Archive
Guides and Experts Analog
Avenue EDA Tools PLD DSP EDA Embedded
Systems Power Test
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