Opinion

Challenges Confront RFIC, WLAN Testing by Raimondo P. Sessego, Director, RF Test Product Group, Amkor
Like the prices of any products that compete largely in the consumer market, those of wireless devices such as LANs and cell phones are being squeezed constantly. That, in turn, means relentless downward price pressure on RF ICs. One of the most important ways to keep their costs down is to achieve the lowest possible test cost.

Synthetic Test Systems, The Future of Test: Available Today -- Part 1 by Marvin Rozner, Jr., Aeroflex Inc.
Instruments that can synthesize stimulus or measurement use a combination of algorithms and hardware modules. The benefits of a malleable and upgradeable synthetic-instrument system can be compelling. Author Marvin Rozner, Jr., Product Manager for Synthetic Instruments at Aeroflex, makes the case.

Design-for-Test has Multiple Dimensions, Experts Say
How to Reduce Digitizing Oscilloscope Delta-Time Errors
Military Technologies: The Push and the Challenge
Opinion : Archive

Reviews

LTC4150: Battery Gas Gauge Counts Charge and Discharge in Handheld PCs and Portable Products
Low Cost Modules Ease High-Speed Serial Loopback Tests
Agilent Crafts Windows XP Pro Bits To Enhance Its Infiniium Scopes
Aeroflex Supports Its Synthetic Test Thrust With PXI Hardware
Tektronix Scopes Ease Validation, Debuggging, Characterization of Highest-Speed Designs
Universal Protocol Analyzer Gets PCI Express Module
LeCroy's Windows-Equipped Bench Scopes Tout High-End Features
Versatile Solid-State Relay Card Is Amply Supported
Eight New ICs Target 2 GHz to 50 GHz Test
Portable Meters Check AC Power Quality
Reviews : Archive

Technical Notes

Synthetic Test Systems, The Future of Test: Available Today -- Part 1
How to Reduce Digitizing Oscilloscope Delta-Time Errors
Statistical Process Control Can Improve Automated Production Testing -- Part 2: Implementation
Statistical Process Control Can Improve Automated Production Testing -- Part 1: The Adoption of Statistical Process Control
Technical Notes : Archive

Editorial

Tech-Toys: Will They Stand the Test of Time? by By Alex Mendelsohn, Sr. Technical Editor, ChipCenter
Old toys have value beyond the dollar amounts the Antiques Roadshow experts might place on them. Are children still saving toys? And how do today's toys compare to those you cherished from your childhood?

Editorial : Archive

Guest Column

USB Data-Acq Attack by Alex Mendelsohn, Senior Technical Editor Alex Mendelsohn
Legacy PC users may miss them, but most new PCs are devoid of parallel printer ports, and in many cases even the venerable serial I/O connector. Universal Serial Bus is taking center stage, as Centronix and RS-232 conventions fade into PC history.

Communications Test Equipment Evolves In Hard Times by Alex Mendelsohn, Senior Technical Editor Alex Mendelsohn
Senior Tech Editor Alex Mendelsohn summarizes the state of the industry with respect to communications-oriented test-and-measurement. Despite a sluggish economy (or perhaps because of it), test gear continues to get better, faster, and cheaper.

Guest Column : Archive

Briefs

Pact Promises Enhanced Board-Level Data-Acq Products
Briefs : Archive

Focus On

Communications Test Equipment Evolves In Hard Times
Focus On : Archive

Earlier Product Reviews

Handheld RF Spectrum Analyzer Raises the Bar to 4 GHz (Product of the Week)
Fluke Boosts Handheld Scope Family by Doubling Bandwidth
Transparent-Packaged Chip Senses Color

More Product Reviews

Earlier Tech Notes

Technical Features.
Instrumentation I/O Enters a New Age With USB and Local Area Networking by Bertram S. Kolts
Emerging Test Challenges for Multi-Level-Signal Gigabit Ethernet—Part 2: Timing and Functional Testing Issues by George Schroeder
Emerging Test Challenges for Multi-Level-Signal Gigabit Ethernet—Part 1: Introduction by George Schroeder
Debugging a PCI Bus With a Mixed-Signal Oscilloscope—A Real-World Example by Vivian Patlin
Precision Analog-to-Digital Converter Architecture Trade-Offs by Robert Schreiber
Test Resource Partitioning for Concurrent Test—Part 3: A Cell-Phone Example by Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink
Test Resource Partitioning for Concurrent Test—Part 2: The Challenges Ahead by Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink
Improving the Accuracy and Speed of Electronic-Load Current Measurements by Jim Dougherty and Isaac Benatar
Test Resource Partitioning for Concurrent Test—Part 1: Introduction by Klaus-Dieter Hilliges, Ajay Khoche, Dave Armstrong, and Erik Volkerink
Boundary-Scan Testing—Part 4: Backplane System Testing by Adam Ley
Boundary-Scan Testing—Part 3: Some Board-Level DFT Guidelines by Gerry Morgan
Boundary-Scan Testing—Part 2: Guidelines for Design by Dave Bonnett
Fundamentals of HALT/HASS Testing by Jon Semancik
Boundary-Scan Testing—Part 1: An Introduction by Dr. R.G. "Ben" Bennetts
Spectral Analysis with Deep-Memory FFT Digital Oscilloscopes—A Practical Application by Marty Grove
Wireless Network Testing on the Threshold of 3G by Sailaja Vepa

More Technical Features
Special Reports Archive

Editorial.
GPS Jammers and Spy-vs.-Spy
My Techno Crystal Ball: Harry Potter's Got Nothin' On Me—Some Year-End Observations
Good and Evil in the Garden of Outsourcing: A Real-World Tale of Intrigue (and Woe)
ChipCenter Previews Test-and-Measurement Report
Hey, I Can See The Ground Under There!
NASA, NORAD, Amateur Radio, and Me
The Photonic Last Mile: Real, Imagined, or Perverse?
It's Information, Not Data
Engineering, Lost Jobs, and The China Syndrome
Peace, Love, and Linux: The Penguin Takes On Redmond XP
Striking Fool's Gold
The Test of Test
Toys of Seasons Past

More Editorials

Guest Column.
Vaporware Chips—Cause or Effect of a Change in the Semiconductor Industry?
Eonic Solutions' Chairman and Marketing Director Eric Verhulst offers his observations on ASICs/SoCs in a "Letter to the Editor" he wrote in response to ChipCenter Senior Technology Editor Alex Mendelsohn's year-end observations through a techno crystal ball.

More Guest Columns

Application Notes

Jitter Measurement Techniques
Jitter is defined as deviation in a clock signal's transition from its ideal position. A consistent method---and precise equipment---must be used when measuring clock jitter. Author Nelson Soo outlines a method you can use to ascertain cycle-to-cycle jitter, period jitter, and long-term jitter.

Oscilloscope designs have used fully differential amplifiers for decades. Why did it take so long for them to appear as commercial ICs? Discover why in "Race Cars, Oscilloscopes, and Fully Differential Amplifiers" by ChipCenter EE Expert Dennis Feucht.

Spectral Analysis with Deep-Memory FFT Digital Oscilloscopes—A Practical Application by Marty Grove

More Application Articles

Resources

Test Links
This page lists some current URLs that you may find of value if you're involved with data acquisition and test. The Web sites present material ranging from tutorial papers to listings of hardware vendors and available software.
Calendar
Find exhibitions, conferences, and educational events that are of direct interest to you as a design and development engineer.
Technology Diary
Technology developments of interest related to Test and Measurement engineering.
ChipCenter Reference Library
This is your access point for lots of good information covering applications, design tools, consultants, intellectual property, trade shows and standards.
Standards Watch
Here is your access point to the standards world.

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